Combining Ability for Resistance to White Mold in a Diallel Cross of Soybean

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general and specific combining ability for resistance to bolting and cercospora leaf spot, technological traits and yield in sugar beet lines using diallel cross analysis

to evaluate general and specific combining ability for resistance to bolting and cercospora leaf spot, 36 hybrids derived from crosses between 9 sugar beet lines along with four checks were planted in safiabad agricultural research center (dezful) in 2008-2009. the experimental design was a triple lattice design with three replications. analysis of variance showed significant differences among ...

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The experiments were carried out in two research stations (MARDI Bukit Tangga, Kedah, and MARDI Seberang Perai, Penang) in Malaysia. The crossings were performed using the four inbred lines in complete diallel cross including selfs and reciprocals. We evaluated the yield components and fruit characters such as fruit yield per plant, vine length, days to fruit maturity, fruit weight, total solub...

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Meta-QTL for resistance to white mold in common bean

White mold, caused by the fungus Sclerotinia sclerotiorum (Lib.) de Bary, is a major disease that limits common bean production and quality worldwide. The host-pathogen interaction is complex, with partial resistance in the host inherited as a quantitative trait with low to moderate heritability. Our objective was to identify meta-QTL conditioning partial resistance to white mold from individua...

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ژورنال

عنوان ژورنال: Brazilian Archives of Biology and Technology

سال: 2019

ISSN: 1678-4324,1516-8913

DOI: 10.1590/1678-4324-2019170610